High Voltage
electric power transmission is > 35,000 volts and for safety AC > 1000 and DC > 1,500. AKA: HV
See Also: High Voltage Switching, High Voltage Meters, High Voltage Detectors, High Voltage Programmable Power Supplies, HV
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1T30-8
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type G, Ø1.50mm, 305gf
K100-G150305-SKAU
K100 Series, Pitch 100mil, Tip Style G, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
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High Density Multiplexer Module
1260-35
The Astronics 1260-35 is a high-density scanner or multiplexer, ideal for applications with large switching requirements. The 1260-35 can be user-configured in many ways, from a 1x96 two-wire to sixteen 1x6 two-wire multiplexers, switching up to 250 VDC and 1A per channel.
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Alternate 2.14 (61.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-72I8-6
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-25I35-2
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25UN-16
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 230gf
K100-I126230-SKAU
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 230gf, Steel with Gold Plating.
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Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72U-7
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1T1-6-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High Precision Electronic Load
PEL-8000
PEL-8000 series adopts high-performance chip high-speed and high-precision design, providing resolution of 0.1mV, 0.01mA (basic accuracy is 0.03%, basic current rise rate is 2.5A / US)
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High Resolution Hand-Held Synchro Meter
DSM-5
.01 Degree ResolutionSunlight Readable DisplayBattery Operated47-440hz11.8VL-L or 90VL-L
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T1-2
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High Precision Angular Positioning, Calibration and Geometry INspection
LabStandard AIR
Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.The LabStandardAIR has been designed as a “Contact Free” system and eliminates features, which may detract from achieving the optimum rotational performance. The rotating elements are supported on super high precision, air lubricated, hydrostaticbearings and are not subject to disturbances associated with gear drives.
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-1L18-10
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Dynamically Controlled High Speed Digital I/O PXI Card
GX5280 Series
The GX5280 Series are high performance, cost-effective 3U PXI dynamic digital I/O boards with 32 TTL input or output channels and 32 LVDS input or output channels. The GX5280 Series offers an industry leading 512 MB of on-board memory and supports test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-1T1-10
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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High Speed Spectroscopy Camera
SynapsePlus CCD
Superfast electronics (up to thousands of spectra per second). Very low read noise. Best linearity in its class. Different chip types to suit every spectroscopy need. Open Electrode (OE) 1024 x 256 pixels, Front-illuminated UV enhanced (FIUV) - 2048 x 512 pixels, Front-illuminated visible (FIVS) - 2048 x 512 pixels, Back-illuminated UV enhanced (BIUV) - 1024 x 256 and 2048 x 512 pixels, Back-illuminated visible (BIVS) - 1024 x 256 and 2048 x 512 pixels, Back-illuminated deep depletion (BIDD) – 1024 x 256 pixels.
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Multiple (8) High Power Four Quadrant Power Source
PM0825
The PM0825 consists of 8 fully independent four-quadrant power sources capable of supplying up to ±20V. Two of the sources are capable of up to 500mA each, four more are capable of performing at low levels with ranges of 1uA and 100uA; the remaining two are mid range with current ranges of 1mA and 100mA.
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AI-Based Analytics for Lower-Power Consumption & High Speed Data Processing
Extreme Search
Introducing Extreme Search, an integrated collection of powerful AI-based analytics functions engineered for speed and transportability. The suite provides fast, flexible and comprehensive statistical reasoning, predictive analytics and query capabilities in any computing environment.
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1T1-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1T24-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25UN-4
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1T1-4-S
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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LXI High Density 384x8 Matrix with BIRST
60-550-026
High-density single pole matrix module capable of switching up to 300VDC/250VAC, or 2A (60W max). The use of high-quality electro-mechanical relays offer high switching confidence and make it suitable for signal routing in large ATE systems.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type C, Ø1.50mm, 155gf
K100-C150155-SKAU
K100 Series, Pitch 100mil, Tip Style C, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
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Low Voltage Holiday Detector
M1-AC
For use such as: Coatings, in-plant environments, rebar, pipelines, sheet materials coated with thin film under 20milsa,
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Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25I40-16
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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PXI High Density Precision Resistor Module, 9-Channel, 2.5Ω to 3.55kΩ
40-298-023
The 40-298-023 is a high density programmable resistor module with 9 channels which can be set between 2.5Ω and 3.55kΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.